A German research institute active in metrology has developed a cantilever solution to improve 3D measurements sensitivity in atomic force microscopy.
Today's atomic force microscopy, or AFM for short, is faced with the challenge of reliably measuring three-dimensional structures. Up to now, this has not worked completely flawlessly: commercially available cantilevers, that is the sensing element of an AFM, react unbalanced when they are exposed to forces of the three spatial dimensions.